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Beilstein J. Nanotechnol. 2023, 14, 725–737, doi:10.3762/bjnano.14.59
Figure 1: Schematic diagram of the KPFM system employed in this analysis. While an ac + dc potential is appli...
Figure 2: KPFM measurement under ambient conditions on the surface cross section of the sample under dark con...
Figure 3: (a) Cross-sectional profile at equilibrium of the surface band energies (black: valence band maximu...
Figure 4: KPFM measurement under ambient conditions on the surface cross section of the sample under illumina...
Figure 5: SPV profile along the structure calculated from the values of VCPD/dark and VCPD/light shown in the...
Figure 6: Cross-sectional profile at equilibrium of the surface band energies (black: valence band maximum, EV...
Figure 7: Cross-sectional profile at equilibrium of the surface band energies (black: valence band maximum, EV...
Figure 8: Representation of the energy band profile in a p-type semiconductor under dark conditions and under...